IP Design Exchange Format for FMEDA and Fault Injection (IPD-XML) - Brochure


A key challenge for complex semiconductor chips is to pass safety and reliability assessments for application in safety and mission-critical systems. Safety standards, such as IEC 61508, ISO 26262, ARP4761, EN 50126 and others, have identified failure mode, effects and diagnostic analysis (FMEDA) as the state-of-the-art method to assess and quantify the failure characteristics of an integrated circuit (IC).

With the advent of ISO/PAS 19451 (2016) and the corresponding ISO 26262, Part 11: “Guidelines on application of ISO 26262 to semiconductors” (2018), a detailed approach exists to perform FMEDA in the context of automobile systems.

This technical specification document details how ANSYS medini analyze can be used to meet these requirements for semiconductors.


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