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Temperature Dependence of Electrical Overstress

Electrical overstress is typically defined as an over voltage or over current event with a duration exceeding 100 to 1000 nanoseconds and nominal durations of 1 millisecond that occurs while the device is in operation. It is typically differentiated from electrostatic discharge (ESD), which has a shorter duration (1 nanosecond to 1 microsecond) and is primarily an issue during nonoperational manufacturing and handling. Events that can lead to EOS damage include voltage spikes, lightning strikes and any temporary and unexpected connections to power or ground.

To understand the influence of temperature on the probability of electrical overstress, the temperature dependence of dielectric breakdown and Joule heating must be reviewed and discussed. Read this white paper to learn more. 


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