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Foundations of Semiconductor Power Integrity Analysis and Simulation

The SEVENTH installment of the Ansys HFSS Foundation webinar series is here! In this webinar, you will gain a deeper understanding of the mathematical underpinnings of Redhawk-SC and its application in Power analysis and Power integrity.

About this Webinar

This webinar will start with the foundations of IR-drop and Dynamic Voltage Drop analysis and simulation for SoC (System-on-Chip). The properties of RLC for advanced FinFET nodes and how to perform IR/DvD through large-scale matrix operations will be discussed. The second part of the webinar will go into the techniques needed for 3DIC IR/DvD sign-off.

What you will learn

  • The basic of IR/DvD analysis and simulation will be discussed
  • The specific requirements for power/ground grid RLC extraction of advanced FinFET nodes
  • Challenges with 3DIC IR/DvD simulation and Redhawk-SC solutions

Who should attend

Both current users and users of competitor solvers (Dassault CST, Altair FEKO, Cadence Clarity)


Norman Chang

Co-founded Apache Design Solutions in February 2001 and served as Ansys Fellow and Chief Technologist of Electronics, Semiconductor, and Optics, Ansys. He's presently leading AI/ML and security initiatives for Ansys. Dr. Chang received his Ph.D. in Electrical Engineering and Computer Sciences from the University of California, Berkeley. He holds twenty patents and has co-authored over 50 technical papers, including the book "Interconnect Analysis and Synthesis."

Altan Odabasi

He joined Ansys in 2015 with the acquisition of Gear Design Solutions, which he had co-founded. He's worked for startups and enterprises in EDA (electronic design automation) for over 20 years. He has a Ph.D. in Electrical and Computer Engineering department at Carnegie Mellon University. He serves as Ansys Fellow in Electronics, Semiconductor, and Optics Business Unit.




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