STACK is an ideal solution for the rapid analysis of thin film multilayer stacks such as anti-reflection coatings, filters, OLEDs, and VCSELs. By utilizing analytical methods, STACK is considerably faster than direct simulations of Maxwell’s equations. A wide variety of functions are available to accurately capture interference and microcavity effects under both plane-wave and dipole illumination.

Key STACK applications include:

  • Thin-film multilayer
  • VCSELs
  • Transparent OLEDs
  • Antireflective coating
  • Microcavities