Users can take advantage of the seamless workflow in Electronics Desktop, which includes advanced electromagnetic field solvers, and dynamically link them to power circuit simulators to predict EMI/EMC performance of electrical devices. These integrated workflows avoid repetitive design iterations and costly recurrent EMC certification tests. Multiple EM solvers intended to address diverse electromagnetic problems, as well as the circuit simulators in Electronics Desktop, help engineers assess the overall performance of their electrical devices and create interference-free designs. These diverse problems range from radiated and conducted emissions, susceptibility, crosstalk, RF desense, RF coexistence, cosite, electrostatic discharge, electric fast transients (EFT), burst, lightning strike effects, high intensity fields (HIRF), radiation hazards (RADHAZ), electromagnetic environmental effects (EEE), electromagnetic pulse (EMP) to shielding effectiveness and other EMC applications.

EMIT’s powerful analysis engine computes all important RF interactions including non-linear system component effects. Diagnosing RFI in complex environments is notoriously difficult and expensive to perform in a testing environment, but with EMIT’s dynamic linked results views, the identification of the root-cause of any interference is rapidly accomplished via graphical signal trace-back and diagnostic summaries that show the exact origin and path that interfering signals take to each receiver. Once the cause of interference is uncovered, EMIT enables rapid evaluation of various RFI mitigation measures in order to arrive at the optimum solution. The new HFSS/EMIT Datalink allows the model for RFI analysis to be created in EMIT directly from the physical 3-D model of the installed antennas in HFSS. This provides a seamless end-to- end workflow for a complete RFI solution for RF environments ranging from large platform cosite interference to receiver desense in electronic devices.

A candidate array design can examine input impedances of all elements under any beam scan condition. Phased array antennas can be optimized for performance at the element, subarray or complete array level based on element match (passive or driven) far-field and near-field pattern behavior over any scan condition of interest. Infinite array modeling involves one or more antenna elements placed within a unit cell. The cell contains periodic boundary conditions on the surrounding walls to mirror fields, creating an infinite number of elements. Element scan impedance and embedded element radiation patterns can be computed, including all mutual coupling effects. The method is especially useful for predicting array-blind scan angles that can occur under certain array beam steering conditions. Finite array simulation technology leverages domain decomposition with the unit cell to obtain a fast solution for large finite-sized arrays. This technology makes it possible to perform complete array analysis to predict all mutual coupling, scan impedance, element patterns, array patterns and array edge effects.

It includes EMIT, a unique multi-fidelity approach for predicting RF system performance in complex RF environments with multiple sources of interference. EMIT also provides the diagnostic tools needed to quickly identify root-cause RFI issues and mitigate problems early in the design cycle.

HFSS with SI Circuits can handle the complexity of modern interconnect design from die-to-die across ICs, packages, connectors and PCBs. By leveraging the HFSS advanced electromagnetic field simulation capability dynamically linked to powerful circuit and system simulation, engineers can understand the performance of high-speed electronic products long before building a prototype in hardware.