Skip to Main Content

 

Webinar

Radiation Effects on Integrated Circuits

Among the many issues affecting the reliability of semiconductor components in critical systems, radiation effects have always been a concern. They play a major role not only for space borne components but emerging applications in terrestrial environments as well. In this webinar, we will present the susceptibility of ICs to two main radiation effects: total ionizing dose (TID) and single event effects (SEE). We will also cover reliability prediction using simulation methods from a perspective of design, process technology and environment.

SHARE THIS WEBINAR

Erfahren Sie, wie Ansys Ihnen helfen kann

Kontaktieren Sie uns heute

* = Pflichtfeld

Danke für die Kontaktaufnahme

We’re here to answer your questions and look forward to speaking with you. A member of our Ansys sales team will contact you shortly.

Bild in der Fußzeile