Ansys Charge Plus
Charging And Discharging Modeling Solution

Simulate internal charging of conducting and insulating solids to recover electric fields and currents induced by high energy particles and time-varying currents. Assess the risk of dielectric breakdown or the amount of current generated from nuclear interactions of high-energy particles with bulk material. Take advantage of a full-wave finite-element method (FEM) solution for electromagnetism to accurately reproduce current waveforms and analyze risks of EMI.

Electrostatic Discharge in Air Leverage a full-wave, finite-difference time domain (FDTD) solver of Maxwell’s equations, coupled with a non-linear air chemistry module, to accurately simulate the arcing phenomenon in complex CAD geometries. Reproduce flashover events on PCB nets, arcing events in circuit breakers of any voltage, ESD testing standards for electronics, and more. Recover the arc current waveform created during the arc creation to tackle concerns of electromagnetic interference (EMI).

Simulate the surface charging of materials in various low- and high- energy, time-varying, charging environments such as space plasmas, precipitation statics, and triboelectric effects. Assess the risk of communication disruption, material degradation and discharge by locating regions with excessive charge accumulations.

3D Particle Transport Starting from a time-varying flux of high energy primary particles and any source geometry, track interactions of primary and secondary particles with any 3D bulk material. Couple the 3D particle transport with the FEM to infer particle flux, charge deposition rates, currents, electromagnetic fields and energy, while simultaneously calculating how these fields affect the particle interactions. Extract energy spectra by particle type to tackle radiation hardening problems and sneak path analysis.

Simulate electronic and avalanche breakdown of solid dielectrics by leveraging the state-of-the-art coupling of the FEM with the 3D particle transport, integrated in a multi-physics approach of the arcing phenomena. Using a stochastic tree model and the full-wave FEM solution for electronic breakdown, recover the current waveforms generated by arcing events and tackle resulting EMI concerns. With identified arcing regions, assess levels of material degradation and conductivity changes due to carbonization.

Self consistently solve for the surface or internal charging problem to tackle complex charging environments. Use the FEM mesh to track electromagnetic fields in 3D around a surface charging problem or infer how much charge is deposited on a surface from high-energy particles of the 3D transport source, tracked in the FEM volumetric mesh.

Zmatch starts with complex load definitions and synthesizes a matching network for maximum power transfer. It includes both Discrete Frequency and Broadband Match modes. Optimal matching networks are provided in lumped, distributed and hybrid realizations.

Include Bessel, Butterworth, Chebyshev I and II, Elliptic, Gaussian, Delay, Hourglass, Legendre, Matched, Raised Cosine, Tubular, Zigzag, Coupled-Resonator, Low Pass, High Pass, Band Pass, Band Stop, Diplexer, Multi-band and Cross-Coupled Folded Resonator, and Linear Phase. FilterSolutions provides an extraordinarily wide variety of useful and unique filter shapes using precision synthesis methods.

Include Lumped Translation, Inductor Translation, Stepped Impedance, Shunt Stub Resonators, Open Stub Resonators, Spaced Stubs, Dual Resonators, Spaced Dual Resonators, Parallel Edge Coupled, Hairpin, Miniature Hairpin, Ring Resonator, Interdigital and Combline. Synthesis is possible into planar components involving microstrip and inverted microstrip, stripline, symmetric and asymmetric stripline. 

Include Thomas 1 and 2, Sallen & Key, Parallel, Akerberg, Multiple Feedback (MFB), GIC Biquad, GIC Ladder and  Leap Frog.

Bilinear, Impulse Invariant (IIR), Matched Z, Step Invariant, FIR Approximation. FIR Filter Types: Rectangular, Bartlett, Hanning, Hamming, Blackman, Blackman-Harris, Kaiser, Dolph-Cheby, Remez, Raised Cosine, Root Raised Cosine, Cosine Filter, Sine Filter, Matched Filter and Delay Filter.