3D modeling solution of charging, discharging and charge carrier transport across a wide range of applications, in one streamlined workflow.
Ansys Charge Plus supports an array of analyses by leveraging four physics solvers designed to tackle internal and surface charging, particle transport, and arcing across interfaces –all in a streamlined workflow built into the Ansys Discovery CAD interface. Ansys Charge Plus expedites the assessment and management of risk associated to material charging and discharging.
Ansys Charge Plus
Mesh engine enhancements, modeling improvements and further integrations with other Ansys tools are all part of the 2023 R2 release for Ansys Charge Plus.
We've added a native Discovery mesh engine, improving meshing speed and stability using the time domain FEM solver. The updated FDTD solver has a new variable grid mesh feature that can adapt the mesh to geometric requirements.
Compressible fluid dynamics is coupled to the existing electrodynamic and PIC solvers to create an advanced simulation tool for plasma and gas flow modeling.
Ionized gas and surface reactions are now captured by coupling Chemkin-Pro to the PIC and the CFD solvers, providing to allow simulating the complex chemical reactions involved in plasma-assisted processes.
Simulate internal charging of conducting and insulating solids to recover electric fields and currents induced by high energy particles and time-varying currents. Assess the risk of dielectric breakdown or the amount of current generated from nuclear interactions of high-energy particles with bulk material. Take advantage of a full-wave finite-element method (FEM) solution for electromagnetism to accurately reproduce current waveforms and analyze risks of EMI.
Electrostatic Discharge in Air Leverage a full-wave, finite-difference time domain (FDTD) solver of Maxwell’s equations, coupled with a non-linear air chemistry module, to accurately simulate the arcing phenomenon in complex CAD geometries. Reproduce flashover events on PCB nets, arcing events in circuit breakers of any voltage, ESD testing standards for electronics, and more. Recover the arc current waveform created during the arc creation to tackle concerns of electromagnetic interference (EMI).
Simulate the surface charging of materials in various low- and high- energy, time-varying, charging environments such as space plasmas, precipitation statics, and triboelectric effects. Assess the risk of communication disruption, material degradation and discharge by locating regions with excessive charge accumulations.
3D Particle Transport Starting from a time-varying flux of high energy primary particles and any source geometry, track interactions of primary and secondary particles with any 3D bulk material. Couple the 3D particle transport with the FEM to infer particle flux, charge deposition rates, currents, electromagnetic fields and energy, while simultaneously calculating how these fields affect the particle interactions. Extract energy spectra by particle type to tackle radiation hardening problems and sneak path analysis.
Simulate electronic and avalanche breakdown of solid dielectrics by leveraging the state-of-the-art coupling of the FEM with the 3D particle transport, integrated in a multi-physics approach of the arcing phenomena. Using a stochastic tree model and the full-wave FEM solution for electronic breakdown, recover the current waveforms generated by arcing events and tackle resulting EMI concerns. With identified arcing regions, assess levels of material degradation and conductivity changes due to carbonization.
Self consistently solve for the surface or internal charging problem to tackle complex charging environments. Use the FEM mesh to track electromagnetic fields in 3D around a surface charging problem or infer how much charge is deposited on a surface from high-energy particles of the 3D transport source, tracked in the FEM volumetric mesh.
Ansys Charge Plus RESOURCES & EVENTS
In this webinar, the 3rd in a 5-part series, we'll consider using the Ansys Charge Plus electromagnetic simulation tool for modeling and simulating charged particle plasmas in aerospace and semiconductor applications.
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