Radiation Effects on Integrated Circuits
Among the many issues affecting the reliability of semiconductor components in critical systems, radiation effects have always been a concern. They play a major role not only for space borne components but emerging applications in terrestrial environments as well. In this webinar, we will present the susceptibility of ICs to two main radiation effects: total ionizing dose (TID) and single event effects (SEE). We will also cover reliability prediction using simulation methods from a perspective of design, process technology and environment.