This datasheet provides an overview of the ANSYS medini analyze product along with information on technical features and functionality.
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ANSYS VRXPERIENCE eliminates costly and time-consuming NCAP physical testing, ensures vehicles receive 4-star and 5-star safety ratings, delivers the highest level of consumer safety and strengthens consumer trust in the OEM’s brand.
Ansys medini analyze helps semiconductor manufacturers in the automotive domain with dedicated ISO 26262 support.
ANSYS VRXPERIENCE Driving Simulator powered by SCANeRTM provides a comprehensive, open and scalable platform for testing advanced driver-assistance systems (ADAS) and autonomous vehicles (AVs) against safety requirements. Using model-in-the-loop (MIL), software-in-the-loop (SIL) and hardware-in-the-loop (HIL) testing, you can virtually log millions of miles per day on high-performance driving simulators, navigating through physics-based virtual reality environments.
The sound your product makes determines a customer’s perception of quality and contributes to your brand image. Excess or unpleasant noise can negatively affect a customer’s emotions while interacting with your product, which might discourage them from using it again. Using ANSYS VRXPERIENCE Sound, you can analyze your product’s baseline sound and create the perfect sound signature for your product to ensure a pleasant customer experience.
This data sheet describes the cutting-edge features of the revolutionary Ansys VRXPERIENCE, which enables you to test and validate vehicle headlamp performance with a real-time, physics-based, state-of-the-art headlamp simulation in an unprecedented virtual driving environment. Ansys VRXPERIENCE is dedicated to the development of dynamic and intelligent lighting systems, incorporating advanced measurement features, highly intuitive UI and much more.
A key challenge for complex semiconductor chips is to pass safety and reliability assessments for application in safety and mission-critical systems. Safety standards, such as IEC 61508, ISO 26262, ARP4761, EN 50126 and others, have identified failure mode, effects and diagnostic analysis (FMEDA) as the state-of-the-art method to assess and quantify the failure characteristics of an integrated circuit (IC).
With the advent of ISO/PAS 19451 (2016) and the corresponding ISO 26262, Part 11: “Guidelines on application of ISO 26262 to semiconductors” (2018), a detailed approach exists to perform FMEDA in the context of automobile systems.
This technical specification document details how ANSYS medini analyze can be used to meet these requirements for semiconductors.