Semiconductors: Tool Support for Chip Level FME(D)A and ISO 26262 - Webinar

ANSYS medini analyze implements key methods to support functional safety analysis for semiconductors according to ISO 26262-11 and IEC 61508. Medini’s model-based approach facilitates a systems approach to FMEA, FME(D)A, FTA, Safety Mechanism Design and Dependent Failure Analysis (DFA). It also provides all the traceability functions required by safety standards.

View this on-demand webinar to see how you can use ANSYS solutions in a seamless workflow to perform FME(D)A and FTA, for example, in a model-driven manner. We will show you how to:

  • Compute base failure rates according to IEC 62380 or SN 29500 with mission profiles
  • Distribute failure rates based on the die area of an imported IP Design
  • Adapt safety mechanisms according to IC usage
  • Cope with design changes in the FME(D)A
I want to receive updates and other offers from ANSYS and its partners. I can unsubscribe at any time. ANSYS Privacy Notice