ANSYS SIwave - Port Radius and Port Impedance Impact on Accuracy - Application Brief

This technical paper provides correlation studies between measured data and multiple field solver technologies, providing multiple references to diff erent types of analyses that include AC frequency domain comparisons for both power integrity and signal integrity. It includes time domain characterization of the results using TDR and noise measurements for both packages and printed circuit boards. Concerning the impact of port reference impedance, some claim that commercial EDA solutions suffer from a limitation in which the accuracy of the solution is dependent on guessing the correct port reference impedance for a PDN prior to simulation. ANSYS SIwave does not suff er from this limitation.
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