Skip to Main Content



Why Electrical Overstress Ranks High in the Failure Pareto

The semiconductor industry has witnessed steady growth over the last few years thanks to emerging applications which are driving the growth of major semiconductor components. Reliable operation of these components is very important in any given application and to ensure reliability component parts must receive extensive testing and burn-in. Despite this integrated circuit (IC) failures are still inevitable.

One of the common failure mechanisms that affects all IC components irrespective of the type of application is electrical overstress (EOS). This phenomenon can affect components without warning and when EOS does occur the damage is done leading to unrecoverable functionality.

This webinar discusses the possible root cause of EOS failures why it ranks high in the failure pareto and how you can mitigate EOS failure risks.


Découvrez ce qu'Ansys peut faire pour vous

Contactez-nous aujourd'hui

* = Champ requis

Merci de nous contacter !

We’re here to answer your questions and look forward to speaking with you. A member of our Ansys sales team will contact you shortly.

Image de pied de page