ANSYS SI Option

HFSS combined with the ANSYS SI option is ideal for analyzing signal integrity, power integrity and EMI issues caused by shrinking timing and noise margins in PCBs, electronic packages, connectors and other complex electronic interconnects. HFSS with the SI option can handle the complexity of modern interconnect design from die-to-die across ICs, packages, connectors and PCBs. By leveraging the HFSS advanced electromagnetic-field simulation capability dynamically linked to powerful circuit and system simulation, engineers can understand the performance of high-speed electronic products long before building a prototype in hardware. This approach enables electronics companies to achieve a competitive advantage with faster time to market, reduced costs and improved system performance. The ANSYS SI option adds transient circuit analysis to HFSS. This allows engineers to create high-speed channel designs that include the driving circuitry as well as the channel. The driving circuitry can be transistor level, IBIS-based or ideal sources. When performing an analysis on these channels, a user can select from a variety of analysis types:

  • Linear network analysis (included with HFSS)
  • Transient analysis
  • QuickEye and VerifEye analyses for fast eye generation in high-speed channel design, bathtub curves, jitter and eye masks
  • Monte Carlo analysis supporting Spectre® and HSPICE® functionality
  • DC analysis with automated convergence
  • Dynamic links with ANSYS Q3D Extractor and ANSYS SIwave
  • IBIS-AMI analysis and model support
Feature Technology SI Option
HFSS Transient Solver 3D Time Domain Solver
2D Extractor 2D FEM Solver
2D Extractor Transmission Line Toolkit 2D FEM Solver
2D Extractor Cable Wizard Toolkit 2D FEM Solver
DC Circuit Analysis (.dc) CKT
Linear Circuit Analysis (.ac) CKT
Transient Circuit Analysis (.tran) CKT
SerDes Eye Circuit Analysis (QuickEye & VeriEye) CKT
Macro-Modeling (Passivity/Causality Checking/Enforcement) CKT
HSPICE Circuit Solver Integration CKT
Automated Circuit Optimization CKT
Network Data Exploration (NdE) CKT
Design of Experiment Analysis CKT
IBIS-AMI Circuit Simulation CKT
IBIS Circuit Simulation CKT
Virtual Compliance CKT

ANSYS SI Option adds Significant Capability to HFSS to Solve Signal and Power Integrity Applications.

DDR3 simulation performed with the ANSYS SI option

DDR3 simulation performed with the ANSYS SI option, showing DQ, DQS and timing eye patterns.

Time Domain Fields

HFSS Transient is the Time Domain version of HFSS based on the Finite Element Time Domain Method. Time domain fields and 3-D TDR analyses are often utilized to gain a better understanding of how electromagnetic waves propagate within antennae, digital electronics or mixed signal systems.

ESD Gun Zap on a mobile device at the micro-usb connector

ESD Gun Zap on a mobile device at the micro-usb connector.

Electric field propagation down a meandered microstrip

Electric field propagation down a meandered microstrip.

Electric field propagating into an unmatched differential via pair

Electric field propagating into an unmatched differential via pair.

Simulated ESD Zapping Station

Electric field propagating into an unmatched differential via pair.

2D Extractor

Transmission Line Toolkit

Transmission Line Toolkit

Cable Cross-section with Electric Fields

Cable Cross-section with Electric Fields

Automotive Cabling Toolkit for creation of cable bundles

Automotive Cabling Toolkit for Creation of Cable Bundles

Nexxim

DDRx Virtual Compliance

DDRx Virtual Compliance

Network Data Exploration

Network Data Exploration (NdE) of SYZ with Passivity/Causality Checking and Enforcement. NdE provides broadband model export in a variety of formats including PSICE, HSPICE, Touchstone, Nexxim State Space and Simplorer models.

IBIS-AMI 8 Gb/s channel

IBIS-AMI 8 Gb/s Channel

IBIS DDR Memory Lane

IBIS DDR Memory Lane