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Enabling ESD Reliability Signoff for AMS IPs - Webinar

View this webinar to discover how ANSYS PathFinder can help you solve the challenges you face in trying to ensure ESD robustness in today’s AMS IPs. Watch a live demonstration of ANSYS PathFinder on an IP-level test case to highlight the benefits of a layout-based ESD integrity solution for resistance and current density checks.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS PathFinder
Product Category: Electronics


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ANSYS in ACTION: Enabling FinFET Thermal Reliability Signoff for IPs - Webinar

ANSYS Totem can solve the challenges faced by engineers trying to ensure thermal and electromigration (EM) reliability in advanced IPs. View this webinar to see a demonstration of self-heat analysis on an IP test case using ANSYS Totem’s rich GUI interface. The demonstration will cover flow setup, debugging and result exploration for reliability signoff.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Totem
Product Category: Electronics


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Solutions de simulation multiphysiques pour le développement de systèmes d'électronique de puissance - Webinar

Vous êtes confrontés à des challenges de mise au point, de performance, de maîtrise des délais et des coûts dans le domaine de l'électronique de puissance ?

Dans ce webinar, vous découvrirez comment la simulation multi-physiques apporte une solution fiable et innovante permettant d'analyser et d'optimiser la performance d'un système.

Author: ANSYS, Inc. Type: Webinar Date:
Product Category: Multiphysics, Electronics


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Enabling Power and Reliability Signoff for AMS Designs - Webinar

View this webinar to learn how ANSYS Totem can model and simulate the required power and reliability signoff checks for AMS designs. This presentation will demonstrate the benefits of using Totem to perform dynamic voltage drop and EM checks through its rich GUI interface, which can also be leveraged for debugging purposes.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Totem
Product Category: Electronics
Sub Industry: Electrical and Electronics


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ANSYS in ACTION: Enabling Early Power and Reliability Analysis for AMS Designs - Webinar

View this webinar to discover the benefits of doing early power and reliability analysis with just a GDS layout. This presentation will demonstrate early IP level connectivity checks; missing via checks; point to point resistance and short path resistance checks; and early static analysis to identify structural design weaknesses using ANSYS Totem’s rich GUI interface.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Totem
Product Category: Electronics


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Physics-based Simulation Solutions for Power Electronics System Development - Webinar

Watch this recorded webinar to learn how you can use ANSYS Simplorer to solve your toughest challenges in designing power electronics systems. The webinar focuses on power losses and thermal design; EMC conducted noise; and analysis of failure modes through fault injection.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Simplorer
Product Category: Electronics


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Physics-Based Simulation Solutions for Power Electronic System Development - Webinar

Physics-based simulation is indispensable in the development of power electronic systems that helps companies reduce development costs, optimize energy efficiency, increase reliability and comply with standards for EMC and safety.

ANSYS provides an extensive and highly integrated set of solutions for modeling and analyzing power electronics, from 3-D physics simulation of critical components to multi-level system simulation of low/medium/high voltage drives, inverters, converters, controls and protection equipment. ANSYS Simplorer uniquely integrates detailed 3-D electromagnetic, electrical and thermal simulations with highly accurate semiconductor devices and VHDL-AMS and Spice components to create power electronic system models that can be virtually tested to analyze and optimize performance.

Learn how ANSYS Simplorer is used in power electronic systems development workflows to simulate and optimize power losses and system efficiency, mitigate EMC problems, understand thermal performance, integrate controls, and inject and assess faults.

 

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Simplorer
Product Category: Electronics


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System Level Chip-Package-System Power Integrity Co-analysis Solutions for 3DICs - Webinar

3DIC design has plenty of technical challenges, from design setup to tape-out, due to its complexity. In particular, seamlessly connecting a power delivery network (PDN) from a voltage regulator module (VRM) through a board, package and interposer to a chip directly impacts the 3DIC performance. A minor error can cause significant performance degradation. Only a fully integrated power integrity analysis solution can predict potential power noise and prevent unexpected performance issues. However, in reality, all components of a 3DIC are implemented in silos, and conventional co-analysis methodologies do not cater to this silo approach.
 
Join us for this webinar in which we will address the technical challenges of 3DIC power integrity analysis and propose a comprehensive CPS-integrated co-analysis solution based on ANSYS products. The proposed solution will include a chip model creation encompassing multiple dies; PDN parasitic extraction of  the interposer, package, and board; seamless connection of all PDN channels; and AC and transient analyses.

Author: ANSYS, Inc. Type: Webinar Date:
Product Category: Electronics


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Using ANSYS Totem to Ensure Power and Noise Integrity of High Performance Analog and Mixed-signal Designs - Webinar

Learn why all major semiconductor companies use Totem for sign-off in their production flow to achieve stringent power noise and reliability requirement for their mixed-signal IP, analog and custom-IC designs, and how Totem is the only solution today that can analyse complex mixed-signal blocks containing both analog and digital content.

Author: ANSYS Type: Webinar Date:
Product Name: ANSYS Totem
Product Category: Electronics
Sub Industry: Semiconductors


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ANSYS in ACTION: Predicting Radio Frequency Interference with ANSYS EMIT

The massive proliferation of wireless devices surrounds us in devices so common — such as smartphones, wearable devices, laptops, sensors and automotive systems — that often we don’t even realize their pervasiveness. With only a finite spectrum in which to operate, the likelihood of these systems interfering with each other and degrading performance of neighboring systems becomes more and more of a problem. The ability to anticipate potential radio frequency interference (RFI) issues that can degrade, or block, system performance is now a critical part of the system level design. View this ANSYS in ACTION webinar where an ANSYS expert will demonstrate the use of ANSYS EMIT for predicting RFI in complex environments.

Author: ANSYS Type: Webinar Date:
Product Name: EMIT
Product Category: Electronics
Sub Industry: Electrical and Electronics


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